Mahr Inc., a global manufacturer of precision measurement equipment, will host a grand opening of its new Midwest Regional Customer Center July 25-26.
In my capacity as the Chair of the Council of the Manufacturing USA institute directors, I often get asked about trends in U.S. advanced manufacturing.
Simcenter Testlab enables better usage of test-based data, from design and simulation to validation and certification.
Marposs said its new Mida Hyper Probing software can achieve an 80% reduction in cycle time, ensuring fast and precise probing.
Metrology-grade laser scanners are expanding their range of applications. New users are finding the main attractions of laser scanners—speed and ease of use. What prevented more widespread use in the past were laser scanners’ perceived tradeoffs. Using one usually meant sacrificing accuracy or working with noisy data.
The Measuring Division of Kaman Precision Products, Inc. announces the availability of its line of Extreme Environment high-precision displacement sensors and systems.
When Desktop Metal introduced its “office-friendly” Studio metal prototype printer earlier this year, the company renewed attention on the issue of safer materials for binder jetting, an additive manufacturing method.
2017 will be an historic time for TDM Systems. We have released our next generation of products that includes two product areas of our software portfolio—standard server/client TDM with TDM 2017 and a new flagship cloud-based software, Global Line.
Manufacturers face a difficult task juggling the current “innovation agenda.” Today, the Industrial Internet of Things (IIoT), robotic automation and artificial intelligence (AI) are all poised to be the next big thing.
Basic trends in modern manufacturing are driving growth in 3D optical metrology. “One is the highly complex and high-tech material that manufacturers are using today. For example, in the aerospace turbine blade market, they simply cannot touch the part like they used to—the surface finish of the material is too readily affected by any kind of contact metrology."
