Gaging Success August 15, 2022 CMMs and other multifunctional metrology devices are becoming faster and more sophisticated, but top-quality gages and measuring tools still have an important place.
Passing the CHIPS February 7, 2023 The U.S. government is investing billions into semiconductor research, development, and production. What does it mean for manufacturers?
Hexagon Enters Pact with NASCAR Team May 10, 2023 Hexagon has joined 14-time NASCAR Cup Series champions Hendrick Motorsports as its official metrology hardware and software provider for the next decade.
BioMADE: Catalyzing the Bioindustrial Manufacturing Revolution November 2, 2023 Securing America’s future through biomanufacturing innovation, education and collaboration
Additive Trailblazers October 30, 2023 Learn how Chuck Hull and Joe Beaman paved the way for manufacturing innovation
DwyerOmega Acquires Automation Components Inc. December 5, 2023 Middleton, Wis.-based ACI is joining Dwyer Instruments, Omega Engineering and Universal Flow Monitors under the DwyerOmega brand.
AM Eases Defense Supply Chain Challenges September 25, 2023 Discover how additive manufacturing (AM) is revolutionizing the defense supply chain. Learn how 3D printing is saving costs, enhancing military readiness, and ensuring rapid parts replacement. From the battlefield to maintenance depots, AM is reshaping military logistics and boosting supply chain security.
Boise Cascade Expands Millwork Business with Acquisition of Brockway-Smith Company August 23, 2023 Boise Cascade's strategic acquisition of BROSCO signals a pivotal step in enhancing its millwork business and expanding its influence in the doors and millwork sector.
Optical Metrology in Three Dimensions May 29, 2018 Basic trends in modern manufacturing are driving growth in 3D optical metrology. “One is the highly complex and high-tech material that manufacturers are using today. For example, in the aerospace turbine blade market, they simply cannot touch the part like they used to—the surface finish of the material is too readily affected by any kind of contact metrology."