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The Digital Manufacturing and Design Innovation Institute (DMDII) today kicked off a new cybersecurity initiative focused on manufacturing.

Scanning metrology providers respond to varied needs; software improves to help engineers with scan data

When it comes to using new materials, medical and dental device makers are ultra-conservative—because they need to clear devices through a thicket of federal regulators.

The U.S. Department of Defense (DoD) is set to award $10 million in funding this year to the Digital Manufacturing and Design Innovation Institute (DMDII) here, UI Labs CEO Caralynn Nowinski Collens, said this morning. UI Labs is DMDII’s parent organization.

As with any digital transformation process, the devil is in the details, and there are many potential pitfalls that can derail projects.

The world of quality measurement devices and software continues to expand, and IMTS years are especially exciting times. If there is a theme in the many offerings—new devices, new software—it might be how quality devices are continuing to burrow their way into the heart of manufacturing on the shop floor.

The road to manufacturing success today runs through the mountain of data that tools are generating in metalcutting applications, and most importantly communicating and reacting to in real time on the shop floor.

Meeting the needs of the evolving digital manufacturing initiative, Open Mind Technologies (Needham, MA) has recently partnered with Heidenhain TNC controls (Schaumburg, IL) to provide exclusive first use of their new NC code-based machining simulation solution hyperMILL Virtual Machining.

As additive manufacturing emerges from a long infancy, the industry is grappling with a key challenge: A file format and design tools from the 20th century are being asked to do 21st century jobs.

“Metrology and its relationship to manufacturing is rapidly evolving,” Ken Woodbine, president, Wilcox Associates, a brand of Hexagon Metrology (North Kingstown, RI), recently observed. “We are seeing larger quantities and faster speeds of measurement data collection. The next challenge is what to do with all that data.”