Skip to content
SME Search Search Results

Displaying 31-40 of 323 results for

Electronics Manufacturing clear Measurement & Metrology clear Casting clear Finishing & Coatings clear Plant Engineering & Maintenance clear

Gages Step Up the Tech

Sophisticated metrology equipment, like coordinate measuring machines (CMMs) and laser scanners, are increasingly seen outside quality labs. “Many companies have cut costs by moving inspection from the lab to the shop floor,” said Matteo Zoin, head of marketing and new market development for Marposs Corp., Auburn Hills, Mich.

Heidenhain Opens Expanded Western U.S. Headquarters

Heidenhain Corp. has opened its newly completed West Coast headquarters. This includes the expansion of its executive, sales and technical support offices, as well as demo facilities in San Jose, Calif. The company also maintains a Midwest headquarters in Schaumburg, Illinois.

CT Scanning Vital for Airworthy Parts

Industrial computed tomography is a cost-effective, reliable way to meet intensifying requirements for qualifying both the design of aerospace parts and the materials needed for their construction.

Aerospace Electrification Challenges, Opportunities

Over the last 30 years, the electrical power demand on aircraft has increased by a factor of 10. While the growth in aerospace E/E systems has introduced new challenges, it is also creating new opportunities.

Measurement Accuracy: What You Need to Know

It’s an old challenge: You’re a manufacturer whose customer needs you to assure that the part you’ve contracted to make for them will be held to specified tolerances. So, what’s the best method for making sure the part is within spec?

Optical Metrology in Three Dimensions

Basic trends in modern manufacturing are driving growth in 3D optical metrology. “One is the highly complex and high-tech material that manufacturers are using today. For example, in the aerospace turbine blade market, they simply cannot touch the part like they used to—the surface finish of the material is too readily affected by any kind of contact metrology."