Abrasive machining is a tried-and-true technology for meeting exacting tolerances and producing superior finishes. Manufacturers continue to develop new capabilities.
An Israeli company has developed new artificial intelligence technology that promises to dramatically change how original equipment manufacturers and their suppliers conduct quality control inspections.
Heidenhain Corp. has opened its newly completed West Coast headquarters. This includes the expansion of its executive, sales and technical support offices, as well as demo facilities in San Jose, Calif. The company also maintains a Midwest headquarters in Schaumburg, Illinois.
Metrology-grade laser scanners are expanding their range of applications. New users are finding the main attractions of laser scanners—speed and ease of use. What prevented more widespread use in the past were laser scanners’ perceived tradeoffs. Using one usually meant sacrificing accuracy or working with noisy data.
It’s a sad fact of practically all metal removal operations that, no matter how sharp the tool or free-machining the material, there are going to be burrs, hanging chads, ragged corners, and other edge quality issues that must be dealt with before calling the workpiece complete.
In my capacity as the Chair of the Council of the Manufacturing USA institute directors, I often get asked about trends in U.S. advanced manufacturing.
Simcenter Testlab enables better usage of test-based data, from design and simulation to validation and certification.
A new partnership between Impossible Objects and Ricoh 3D will make strong and lightweight printed composite parts available to Ricoh 3D’s customers in Europe for the first time.
Anyone who’s worked with wind turbine blades or just seen one up close can attest to the massive size of these clean-energy workhorses. Ever thought about what happens to that costly, high-tech material once the blade reaches the end of its lifespan in 20 years or so?
The new Metrology Gate portal from LK Metrology provides remote access to information of connected metrology devices