Starrett Appoints Jim VandeHei Director of Sales, Metrology Systems April 6, 2021 The L.S. Starrett Company has appointed Jim VandeHei Director of Sales, Starrett Metrology Systems.
New Data Collection Technology Ensures Speed, Accuracy, Scalability and Security May 21, 2021 Roush Yates Engines explored ways to improve the accuracy, integrity and throughput of its measurement data, and decided to implement DataSure 4.0, a data acquisition solution developed by The L.S. Starrett Co.
Enhanced X-ray CT from Nikon for Large Components May 28, 2021 Nikon Metrology’s industrial microfocus X-ray CT inspection solutions now enhanced with a new offset CT reconstruction algorithm to deliver faster scan speed and image resolution.
Hexagon offers new precision non-contact CMM sensor March 1, 2021 Chromatic white-light sensor increases options for rapid non-contact scanning, helps electronics and medical manufacturers succeed with emerging technologies
Chasing Gold in A&D Manufacturing October 25, 2021 ORNL has partnered with MSC Industrial Supply to deliver a service that improves the material removal rate of existing equipment by a factor of three, on average, by correctly using cutting conditions based on measurements.
Community of Manufacturing Builds Better Outcomes October 27, 2021 Phillips Corp. aims to provide young people with the tools to create meaningful manufacturing careers.
Mazak’s New MPower Support Program August 23, 2021 New program empowers manufacturers through customer care for the life of their machines
E-mobility Increases Issues for Leak Detection August 5, 2021 Today’s rapid and unexpected growth in the production of vehicles with alternative drive systems is giving carmakers and their manufacturing partners a wide range of leak-detection challenges to ensure vehicle quality.
Hexagon Debuts AS1 Laser Scanner at FABTECH 2021 September 3, 2021 Hexagon’s Manufacturing Intelligence division announced the North American debut of its AS1 Scanner will be held at FABTECH 2021, Sept. 13-16, 2021, McCormick Place, Chicago, IL. In Booth A3326 in the South Building.
New Software for Remote Monitoring of Inspection Devices December 16, 2020 The new Metrology Gate portal from LK Metrology provides remote access to information of connected metrology devices