Over the last 30 years, the electrical power demand on aircraft has increased by a factor of 10. While the growth in aerospace E/E systems has introduced new challenges, it is also creating new opportunities.
Capture 3D becomes part of the ZEISS Industrial Quality & Research segment, following ZEISS acquisition of GOM, makers of the ATOS systems Capture 3D resells.
Company says smart features empower simplified experimental workflows.
Texas Instruments celebrates the groundbreaking of LFAB2, a cutting-edge semiconductor fab in Lehi, Utah, while also investing in STEM education to empower students for the future.
Middleton, Wis.-based ACI is joining Dwyer Instruments, Omega Engineering and Universal Flow Monitors under the DwyerOmega brand.
CMMs and other multifunctional metrology devices are becoming faster and more sophisticated, but top-quality gages and measuring tools still have an important place.
Modern manufacturing is rapidly adopting model-based definition (MBD). When employing an MBD strategy, the CAD model becomes more than the nominal to which all parts are measured and inspected against. MBD keeps the all-important digital thread intact—from design to manufacturing to inspection and quality reporting.
Technology is changing ever more rapidly. Sometimes this means topics learned in engineering or technical school become obsolete. Whole new fields emerge within a few years, so that even those with freshly minted educations suddenly find themselves faced with new challenges.
While suppliers are under more pressure than ever to produce precision parts faster and with less scrap, in-process metrology means manufacturers can detect as soon as possible when a part is going wrong, correcting the issue quickly and saving it from scrap.
Basic trends in modern manufacturing are driving growth in 3D optical metrology. “One is the highly complex and high-tech material that manufacturers are using today. For example, in the aerospace turbine blade market, they simply cannot touch the part like they used to—the surface finish of the material is too readily affected by any kind of contact metrology."