New Data Collection Technology Ensures Speed, Accuracy, Scalability and Security May 21, 2021 Roush Yates Engines explored ways to improve the accuracy, integrity and throughput of its measurement data, and decided to implement DataSure 4.0, a data acquisition solution developed by The L.S. Starrett Co.
ZEISS to Acquire Capture 3D May 11, 2021 ZEISS said it has agreed to acquire Capture 3D. Financial terms were not disclosed.
Starrett Appoints Jim VandeHei Director of Sales, Metrology Systems April 6, 2021 The L.S. Starrett Company has appointed Jim VandeHei Director of Sales, Starrett Metrology Systems.
Mitutoyo America Corporation Releases AI Inspect Software April 1, 2021 Mitutoyo America Corporation releases new Mitutoyo AI Inspect Software to its lineup of software solutions
Hexagon offers new precision non-contact CMM sensor March 1, 2021 Chromatic white-light sensor increases options for rapid non-contact scanning, helps electronics and medical manufacturers succeed with emerging technologies
CMMC: Experts parse DoD’s new cybersecurity rules January 19, 2021 Current and prospective member companies of the defense industrial base (DIB) have watched with interest as the U.S. Department of Defense (DoD) developed its all-encompassing Cybersecurity Maturity Model Certification (CMMC) program.
LK Metrology Introduces Ultra-Accuracy Portable Measuring Arms February 19, 2021 The new five ultra-accuracy models are offered in both 6-axis and 7-axis variants
Siemens extends Xcelerator portfolio with quality management January 27, 2021 Teamcenter Quality software, now provides a closed-loop approach for quality management.
Model-Based Definition in the Tiers January 25, 2021 Can small and medium-sized manufacturers, Tier 2 or Tier 3 guys, use all-digital descriptions of part orders, dispensing with paper specifications and supplemental drawings to efficiently deliver parts?
New Software for Remote Monitoring of Inspection Devices December 16, 2020 The new Metrology Gate portal from LK Metrology provides remote access to information of connected metrology devices
