Industry 4.0 and Smart Manufacturing: Leveraging the Power of Real-Time Data Visualization December 11, 2020 Today’s manufacturers are under pressure to be more flexible, reduce downtime and costs and increase efficiencies.
Hexagon offers new precision non-contact CMM sensor March 1, 2021 Chromatic white-light sensor increases options for rapid non-contact scanning, helps electronics and medical manufacturers succeed with emerging technologies
Thanks for the Memories! January 7, 2022 Manufacturing Engineering editor-in-chief Alan Rooks is retiring.
Getting AMRs to work well with others February 8, 2022 Interoperability will make the autonomous mobile robot’s world go ‘round
New President and CEO Named at TRUMPF Inc. February 2, 2022 Lutz Labisch to Become President and CEO for TRUMPF in North America
Olympus Releases new LEXT OLS5100 Laser Microscope November 11, 2020 Company says smart features empower simplified experimental workflows.
Nikon Metrology Launches Next-Generation Laser Radar Inspection System October 29, 2020 The measuring and inspection arm of Japanese camera giant Nikon, Nikon Metrology, debuts APDIS, a Laser Radar inspection system the company claims is up to 10 times faster than conventional measurement tools, saving production lines time and money.
Nikon Metrology Partners with NSI Microscopy Inspection Automation November 17, 2020 Nikon Metrology today announced a new partnership with NSI Microscopy Inspection Automation of Wexford, Ireland. The agreement will help customers with Continuous Process Improvement by making use of automated microscopy, according to the company.
Investment Banking Practice Aimed at Robotics, Automation, AI Launched October 15, 2020 Cascadia Capital said it is launching one of the nation’s first emerging growth investment banking practice groups dedicated to Robotics, Automation, and Artificial Intelligence (RAAI).
New Software for Remote Monitoring of Inspection Devices December 16, 2020 The new Metrology Gate portal from LK Metrology provides remote access to information of connected metrology devices