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The L.S. Starrett Company has appointed Jim VandeHei Director of Sales, Starrett Metrology Systems.

Mitutoyo America Corporation releases new Mitutoyo AI Inspect Software to its lineup of software solutions

Chromatic white-light sensor increases options for rapid non-contact scanning, helps electronics and medical manufacturers succeed with emerging technologies

The new five ultra-accuracy models are offered in both 6-axis and 7-axis variants

Teamcenter Quality software, now provides a closed-loop approach for quality management.

Can small and medium-sized manufacturers, Tier 2 or Tier 3 guys, use all-digital descriptions of part orders, dispensing with paper specifications and supplemental drawings to efficiently deliver parts?

The new Metrology Gate portal from LK Metrology provides remote access to information of connected metrology devices

Today’s manufacturers are under pressure to be more flexible, reduce downtime and costs and increase efficiencies.

Company says smart features empower simplified experimental workflows.

Nikon Metrology today announced a new partnership with NSI Microscopy Inspection Automation of Wexford, Ireland. The agreement will help customers with Continuous Process Improvement by making use of automated microscopy, according to the company.