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Laser Scanners Demand Attention as Technology Improves

Metrology-grade laser scanners are expanding their range of applications. New users are finding the main attractions of laser scanners—speed and ease of use. What prevented more widespread use in the past were laser scanners’ perceived tradeoffs. Using one usually meant sacrificing accuracy or working with noisy data.

Automating Measurement on the Shop Floor

It’s amazing what you can learn at a trade show. Editor in Chief Alan Rooks was reminded of this at the recent EASTEC show. He reflected on his visit with Joe Stanford, vice president, engineering and applications support for Applied Measurement Solutions LLC, Bristol, Conn., the largest metrology distributor for The L.S. Starrett Co., Athol, Mass.

Sunnen and ANS Collaborate on Friction and Wear Reduction Technology

Sunnen Products Co. and Sweden’s Applied Nano Surfaces (ANS) have entered into a joint market development agreement to advance technology and applications based on the unique Triboconditioning process recently patented by ANS. The process reduces friction and wear on various steel and cast iron surfaces while improving surface finish, preventing seizures, and enhancing product life.

Today’s Grinders Must Do It All for HMLV Production

When it comes to the production of high-precision parts for industries ranging from aerospace to medical, grinding remains the best, most cost-effective approach to obtaining fine surface finishes and tight tolerances.

Voestalpine Eifeler Coatings Opens New Facility in California

Voestalpine Eifeler Coatings announced today the opening of their newest coatings facility in Walnut, California. The new facility is located to provide Physical Vapour Deposition (PVD) coatings solutions to the manufacturing communities in California and the Western United States, according to the company.

Structured Vision in Manufacturing

Structured light systems measure surfaces by projecting a pattern of fringes, then using cameras and sophisticated software to convert them into point clouds of metrology data. Accuracy can reach the single-digit microns over millions of points.