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Scanners Measure Up

Laser scanners and structured white light scanners for metrology are advancing at the same time that customer are demanding major improvements. As a result, scanning technologies are making rapid progress.

Altair Announces Integrated Platform

Altair announced Altair One, which the company described as "a fully integrated platform that brings together the company’s entire product suite and HPC capabilities to facilitate seamless collaboration and faster time-to-market."