Starrett Appoints Jim VandeHei Director of Sales, Metrology Systems April 6, 2021 The L.S. Starrett Company has appointed Jim VandeHei Director of Sales, Starrett Metrology Systems.
Mitutoyo America Corporation Releases AI Inspect Software April 1, 2021 Mitutoyo America Corporation releases new Mitutoyo AI Inspect Software to its lineup of software solutions
Hexagon offers new precision non-contact CMM sensor March 1, 2021 Chromatic white-light sensor increases options for rapid non-contact scanning, helps electronics and medical manufacturers succeed with emerging technologies
As Smart Factory Security Improves… Vigilance is Key February 14, 2023 Proliferation of cyber threats puts manufacturers at risk
Manufactured Disruption: Securing Cyber-Physical Systems February 10, 2023 Manufacturers need to adopt proactive threat modeling for their cyber-physical systems to map the connections between IT and OT.
Navigating Cybersecurity Maturity Model Certification (CMMC) 2.0 February 9, 2023 DoD steps up cyber safety rules for suppliers
Advanced Optic Sensors and Probes Lift Aerospace Production December 19, 2022 Advances in metrology are key in reducing expensive, wasteful scrap.
Large-Scale Scanning and Automation Primed for eVTOL Development December 5, 2022 The design and production of electric vertical-take-off-and-landing (eVTOL) aircraft may be aided by advancements in technology.
Where Innovative Manufacturers Forge the Future: MxD November 7, 2022 MxD equips U.S. manufacturers with digital tools and expertise to help build every part better
Laser Processing Is Having Its Moment October 28, 2022 Improvements in efficiency and scaling make laser processing a preferred choice for manufacturers.
